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33645534038
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Normalizing elemental XPS signals by the corresponding Scofield factors (ref 36) is a standard way to correct for element-dependent photoelectric cross sections, the major factor that determines element-specific XPS intensities. This normalization ignores any spatial distribution of the elements, but provides a practical way to compare elemental intensities, as such Scofield-adjusted intensity ratios often appear in quantitative XPS analysis models (see Appendix).
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The Tougaard model with parameters established for SAMs/Au (ref 26) predicts intensities of inelastic backgrounds to be much lower than the observed high-BE shoulders of S 2p peaks. The asymmetric S 2p peak shapes thus correspond to multiple S 2p components.
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41
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33645532519
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The spectra were analyzed by nonlinear least-squares fitting to multiple Lorentzian lines, except in the case of the UVO-Pt substrate, in which a Gaussian line shape was required.
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The oxygen-free deposition on TS-Pt substrates resulted in the lowest overall O 1s signals in our study. For C6SH/TS-Pt, the Scofield-adjusted Intensity ratios (same units as in Table SI2) are 227 for the C2 and C3 components, 220 for O Is, and 101 for S2, The total intensity of the oxidized C components is equal to the total 0 signal; thus, the data are consistent with essentially no PtO, on the surface while S2 is still present.
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45
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33645516435
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Uncertainties are one standard deviation averaged over five measurement series.
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