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Volumn 15, Issue 7, 1999, Pages 2414-2419

Formation of alkanethiolate self-assembled monolayers on oxidized gold surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CHEMICAL VAPOR DEPOSITION; CONTACT ANGLE; GOLD; MOLECULAR STRUCTURE; OXIDATION; SULFUR COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0345534673     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981054d     Document Type: Article
Times cited : (40)

References (36)
  • 28
    • 0000992383 scopus 로고
    • λ = 37 Å has been calculated by comparing the Au 4f attenuation for MC-10, MC-18, and MC-22 SAMs on clean gold surfaces. This value is agreement with the λ = 42 Å measured for Al Kα by P. E. Laibinis, C. D. Bain, and G. M. Whitesides (J. Phys. Chem. 1991, 95, 7017) and adjusted for Mg Kα as well as the mean free paths used in: Wesch, A.; Dannenberger, O.; Wöll, Ch.; Wolff, J. J.; Buck, M. Langmuir 1996, 12, 5330. Dannenberger, O.; Weiss, K.; Himmel, H. J.; Jäger, B.; Buck, M.; Wöll, Ch. Thin Solid Films 1997, 307, 183.
    • (1991) J. Phys. Chem. , vol.95 , pp. 7017
    • Laibinis, P.E.1    Bain, C.D.2    Whitesides, G.M.3
  • 29
    • 0000836836 scopus 로고    scopus 로고
    • λ = 37 Å has been calculated by comparing the Au 4f attenuation for MC-10, MC-18, and MC-22 SAMs on clean gold surfaces. This value is agreement with the λ = 42 Å measured for Al Kα by P. E. Laibinis, C. D. Bain, and G. M. Whitesides (J. Phys. Chem. 1991, 95, 7017) and adjusted for Mg Kα as well as the mean free paths used in: Wesch, A.; Dannenberger, O.; Wöll, Ch.; Wolff, J. J.; Buck, M. Langmuir 1996, 12, 5330. Dannenberger, O.; Weiss, K.; Himmel, H. J.; Jäger, B.; Buck, M.; Wöll, Ch. Thin Solid Films 1997, 307, 183.
    • (1996) Langmuir , vol.12 , pp. 5330
    • Wesch, A.1    Dannenberger, O.2    Wöll, Ch.3    Wolff, J.J.4    Buck, M.5
  • 30
    • 0031246382 scopus 로고    scopus 로고
    • λ = 37 Å has been calculated by comparing the Au 4f attenuation for MC-10, MC-18, and MC-22 SAMs on clean gold surfaces. This value is agreement with the λ = 42 Å measured for Al Kα by P. E. Laibinis, C. D. Bain, and G. M. Whitesides (J. Phys. Chem. 1991, 95, 7017) and adjusted for Mg Kα as well as the mean free paths used in: Wesch, A.; Dannenberger, O.; Wöll, Ch.; Wolff, J. J.; Buck, M. Langmuir 1996, 12, 5330. Dannenberger, O.; Weiss, K.; Himmel, H. J.; Jäger, B.; Buck, M.; Wöll, Ch. Thin Solid Films 1997, 307, 183.
    • (1997) Thin Solid Films , vol.307 , pp. 183
    • Dannenberger, O.1    Weiss, K.2    Himmel, H.J.3    Jäger, B.4    Buck, M.5    Wöll, Ch.6
  • 36
    • 0345118790 scopus 로고    scopus 로고
    • note
    • An estimation of the thiol thickness based on the attenuation of the O 1s signal from the buried oxygen is not reliable because some oxygen may dissolve before thiol adsorption and thus the unattenuated O 1s intensity is not known.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.