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These conditions when used for thiols give SAMs whose XPS, infrared, and wetting characteristics are exactly comparable to published data for high-quality films (e.g., Laibinis, P.E.; Whitesides, G.M.; Allara, D.L.; Parikh, A.; Tao, Y.-T.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152). The samples were prepared and stored under typical lab conditions (presence of room air). Extensive characterization showed no evidence for impurities such as adsorbed hydrocarbons or photo-oxidative degradation products.
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33 a near 1:1 composition results. Contact angle and ellipsometry measurements are in accord with these results.
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