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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 1122-1126

Consistency of calculated and measured electron inelastic mean free paths

(2) Powell, C J a Jablonski, A b

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b INSTITUTE OF PHYSICAL CHEMISTRY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001541391 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.581784 Document Type: Article

Times cited : (19)

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