Surface preparation of hard ionic crystals by ultrahigh vacuum cleavage

Review of Scientific Instruments

Volumn 76, Issue 8, 2005, Pages 1-7

  Barth, Clemens ^a   Claeys, Christian ^a   Henry, Claude R ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; MAGNESIA; SURFACE TREATMENT; ZINC OXIDE;

HARD MATERIALS; IONIC CRYSTALS; SCANNING FORCE MICROSCOPY; ULTRAHIGH VACUUM (UHV) CLEAVAGE;

CRYSTALS;

EID: 26444467717     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2001669     Document Type: Article

References (26)

1. V. E. Henrich and P. A. Cox, The Surface Science of Metal Oxides (Cambridge University Press, Cambridge, 1994).
2. C. R. Henry, Surf. Sci. Rep. 31, 231 (1998).
3. C. R. Henry, in Catalysis and Electrocatalysis at Nanoparticles Surfaces, edited by A. Wieckowski, E. R. Savinova, and C. G. Vayenas (Dekker, New York, 2003).
4. A. P. Janssen and A. Chambers, J. Phys. E 7, 425 (1974).
5. B. Dupoisson, P. Dumas, A. Steinbrunn, and J. C. Colson, J. Phys. E 9, 266 (1976).
6. C. Duriez, C. Chapon, C. R. Henry, and J. M. Rickard, Surf. Sci. 230, 123 (1990).
7. C. Claeys, C. R. Henry, and C. Chapon, Meas. Sci. Technol. 2, 81 (1991).
8. C. Barth and C. R. Henry, Phys. Rev. Lett. 91, 196102 (2003).
9. H. Hosoi, K. Sueoka, K. Hayakawa, and K. Mukasa, Appl. Surf. Sci. 157, 218 (2000).
10. C. Barth, A. S. Foster, M. Reichling, and A. L. Shluger, J. Phys.: Condens. Matter 13, 2061 (2001).
11. C. L. Pang, T. V. Ashworth, H. Raza, S. A. Haycock, and G. Thornton, Nanotechnology 15, 862 (2004).
12. C. Barth and C. R. Henry, Nanotechnology 15, 1264 (2004).
13. S. Morita, R. Wiesendanger, and E. Meyer, Noncontact Atomic Force Microscopy (Springer, Berlin, 2002).
14. R. García and R. Pérez, Surf. Sci. Rep. 47, 197 (2002).
15. F. J. Giessibl, Rev. Mod. Phys. 75, 949 (2003).
16. In preparation for Proceedings of NC-AFM 2005 in Nanotechnology.
17. Omicron GmbH (Taunustein, Germany), http://www.omicron.de.
18. J. Lü, L. Eng, R. Bennewitz, E. Meyer, H.-J. Güntherodt, E. Delamarche, and L. Scandella, Surf. Interface Anal. 27, 368 (1999).
19. B. L. Averbach, D. K. Felbeck, G. T. Hahn, and D. A. Thomas, Fracture (MIT Press, Cambridge, MA, 1959).
20. M. T. Sprackling, The Plastic Deformation of Simple Ionic Crystals (Academic, London, 1976).
21. M. Reichling, M. Huisinga, S. Gogoll, and C. Barth, Surf. Sci. 439, 181 (1999).
22. S. Ii, C. Iwamoto, K. Matsunaga, T. Yamamoto, and Y. Ikuhara, Appl. Surf. Sci. 241, 68 (2005).
23. We noticed that voltages of less than -10 V must be frequently applied in order to minimize electrostatic forces, however, sometimes also voltages of more than +10 V. During scanning of the MgO(001) surface, it happens very often that the tip picks up charges while contacting the surface. If the tip changes the sign of its potential, the sign of the bias voltage for minimization electrostatic forces is also changed. However, we believe that the tip is not the dominant contributor to the large electrostatic forces, as already noticed in Ref. 11.
24. H. Kathrein and F. Freund, J. Phys. Chem. Solids 44, 177 (1983).
25. S. Ferrero, A. Piednoir, and C. R. Henry, Nano Lett. 1, 227 (2001).
26. K. Højrup-Hansen, S. Ferrero, and C. R. Henry, Appl. Surf. Sci. 226, 167 (2004).