메뉴 건너뛰기




Volumn 21, Issue 4, 2006, Pages 397-408

Novel nanoscale device architecture to reduce leakage currents in logic circuits: A quantum-mechanical study

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURAL DESIGN; LEAKAGE CURRENTS; MOSFET DEVICES; NANOSTRUCTURED MATERIALS; NUMERICAL ANALYSIS; QUANTUM THEORY;

EID: 33644969674     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/4/001     Document Type: Article
Times cited : (5)

References (27)
  • 1
    • 17644447603 scopus 로고    scopus 로고
    • Sub-10-nm Planar-Bulk-CMOS Devices using Lateral Junction Control
    • Wakabayashi H et al 2003 Sub-10-nm Planar-Bulk-CMOS Devices using Lateral Junction Control IEDM: Proc. IEEE Int. Electron Device Meeting (Washington DC, Dec. 2003) pp 989-91
    • (2003) IEDM: Proc. IEEE Int. Electron Device Meeting , pp. 989-991
    • Wakabayashi, H.1
  • 5
    • 0031693941 scopus 로고    scopus 로고
    • Theory of electron transport in small semiconductor devices using the Pauli Master equation
    • Fishetti M V 1998 Theory of electron transport in small semiconductor devices using the Pauli Master equation J. Appl. Phys. 83 270-91
    • (1998) J. Appl. Phys. , vol.83 , Issue.1 , pp. 270-291
    • Fishetti, M.V.1
  • 6
    • 0000265087 scopus 로고    scopus 로고
    • Nano-scale field-effect-transistors: An ultimate size analysis
    • Pikus F G and Likharev K K 1997 Nano-scale field-effect-transistors: an ultimate size analysis Appl. Phys. Lett. 71 3661-3
    • (1997) Appl. Phys. Lett. , vol.71 , Issue.25 , pp. 3661-3663
    • Pikus, F.G.1    Likharev, K.K.2
  • 7
    • 36449008742 scopus 로고
    • Ballistic metal-oxide-semiconductor-field- effect-transistor
    • Natori K 1994 Ballistic metal-oxide-semiconductor-field- effect-transistor J. Appl. Phys. 76 4879-90
    • (1994) J. Appl. Phys. , vol.76 , Issue.8 , pp. 4879-4890
    • Natori, K.1
  • 8
    • 0042697357 scopus 로고    scopus 로고
    • Leakage current mechanisms and leakage reduction technique in deep sub-micron CMOS circuit
    • Roy K, Mukhopadhyay S and Meimand H 2003 Leakage current mechanisms and leakage reduction technique in deep sub-micron CMOS circuit Proc. IEEE 91 305-7
    • (2003) Proc. IEEE , vol.91 , Issue.2 , pp. 305-307
    • Roy, K.1    Mukhopadhyay, S.2    Meimand, H.3
  • 9
    • 0034459843 scopus 로고    scopus 로고
    • Intrinsic leakage in deep sub-micron CMOS ICs-measurement-based test solutions
    • Keshavarzi A, Roy K and Hawkins C F 2000 Intrinsic leakage in deep sub-micron CMOS ICs-measurement-based test solutions IEEE Trans. VLSI Syst. 8 717-23
    • (2000) IEEE Trans. VLSI Syst. , vol.8 , Issue.6 , pp. 717-723
    • Keshavarzi, A.1    Roy, K.2    Hawkins, C.F.3
  • 10
    • 15244338765 scopus 로고    scopus 로고
    • Accurate estimation of total leakage in Nanometer Scale Bulk CMOS circuits based on device geometry and doping profile
    • Mukhopadhyay S, Raychowdhury A and Ray K 2005 Accurate estimation of total leakage in Nanometer Scale Bulk CMOS circuits based on device geometry and doping profile IEEE Trans. On CAD 24 363-80
    • (2005) IEEE Trans. on CAD , vol.24 , pp. 363-380
    • Mukhopadhyay, S.1    Raychowdhury, A.2    Ray, K.3
  • 13
    • 0030080950 scopus 로고    scopus 로고
    • Device parameter optimization for reduced SCEs in retrograde doping MOSFETs
    • Agarwal B, De V K and Meindl J D 1996 Device parameter optimization for reduced SCEs in retrograde doping MOSFETs IEEE Trans. Electron Devices 43 365-8
    • (1996) IEEE Trans. Electron Devices , vol.43 , Issue.2 , pp. 365-368
    • Agarwal, B.1    De V, K.2    Meindl, J.D.3
  • 14
    • 0000115765 scopus 로고    scopus 로고
    • A 0.1-νm delta-doped MOSFET fabricated with post-low-energy implanting selective epitaxy
    • Noda K, Tatsumi T and Hu C 1998 A 0.1-νm delta-doped MOSFET fabricated with post-low-energy implanting selective epitaxy IEEE Trans. Electron Devices 45 809-13
    • (1998) IEEE Trans. Electron Devices , vol.45 , Issue.4 , pp. 809-813
    • Noda, K.1    Tatsumi, T.2    Hu, C.3
  • 18
    • 0036867746 scopus 로고    scopus 로고
    • Physics based analytical modeling of potential and electric field distribution in dual material gate (DMG)-MOSFET
    • Saxena M, Haldar S, Gupta M and Gupta R S 2002 Physics based analytical modeling of potential and electric field distribution in dual material gate (DMG)-MOSFET IEEE Trans. Electron Devices 49 1928-38
    • (2002) IEEE Trans. Electron Devices , vol.49 , Issue.11 , pp. 1928-1938
    • Saxena, M.1    Haldar, S.2    Gupta, M.3    Gupta, R.S.4
  • 19
    • 0037427063 scopus 로고    scopus 로고
    • Physics based modeling and simulation of dual material gate stack (DUMGAS) MOSFET
    • Saxena M, Haldar S, Gupta M and Gupta R S 2003 Physics based modeling and simulation of dual material gate stack (DUMGAS) MOSFET Electron Lett. 39 155-7
    • (2003) Electron Lett. , vol.39 , Issue.1 , pp. 155-157
    • Saxena, M.1    Haldar, S.2    Gupta, M.3    Gupta, R.S.4
  • 20
    • 3142694441 scopus 로고    scopus 로고
    • Nano-transistors in the Landauer-Bütticker formalism
    • Nemnes G A, Wulf U and Racec P N 2004 Nano-transistors in the Landauer-Bütticker formalism J. Appl. Phys. 96 596-604
    • (2004) J. Appl. Phys. , vol.96 , Issue.1 , pp. 596-604
    • Nemnes, G.A.1    Wulf, U.2    Racec, P.N.3
  • 21
    • 33644973055 scopus 로고    scopus 로고
    • Single particle transport in nanostructures: Theory, implementation and examples
    • Anantram M P 2003 Single particle transport in nanostructures: theory, implementation and examples Lecture notes for Nanolab Spring School (Toulouse, France, May 2003) pp 1-33
    • (2003) Lecture Notes for Nanolab Spring School , pp. 1-33
    • Anantram, M.P.1
  • 22
    • 33644973055 scopus 로고    scopus 로고
    • Single particle transport in nanostructures: Theory, implementation and examples
    • Anantram M P 2003 Single particle transport in nanostructures: theory, implementation and examples Lecture notes for Nanolab Spring School (Toulouse, France, May 2003) 19-23
    • (2003) Lecture Notes for Nanolab Spring School , pp. 19-23
    • Anantram, M.P.1
  • 23
    • 0036684716 scopus 로고    scopus 로고
    • Two-Dimensional Self-Consistent Simulation of a Triangular P-Channel SOI nano-Flash Memory Device
    • Tang X, Baie X, Colinge J P, Gastin C and Bayot V 2002 Two-Dimensional Self-Consistent Simulation of a Triangular P-Channel SOI nano-Flash Memory Device IEEE Trans. Electron Devices 49 1420-26
    • (2002) IEEE Trans. Electron Devices , vol.49 , Issue.8 , pp. 1420-1426
    • Tang, X.1    Baie, X.2    Colinge, J.P.3    Gastin, C.4    Bayot, V.5
  • 24
    • 0041910831 scopus 로고    scopus 로고
    • NanoMOS 2.5: A two-dimensional simulator for quantum transport in double-gate MOSFETs
    • Ren Z, Venugopal R, Goasguen S, Datta S and Lundstrom M 2005 nanoMOS 2.5: A two-dimensional simulator for quantum transport in double-gate MOSFETs IEEE Trans. ED 50 1914-25
    • (2005) IEEE Trans. ED , vol.50 , pp. 1914-1925
    • Ren, Z.1    Venugopal, R.2    Goasguen, S.3    Datta, S.4    Lundstrom, M.5
  • 25
    • 2942573178 scopus 로고    scopus 로고
    • Simulating quantum transport in nanoscale MOSFETs: Ballistic hole transport, subband engineering and boundary conditions
    • Venugopal R, Ren Z and Lundstrom M 2003 Simulating quantum transport in nanoscale MOSFETs: ballistic hole transport, subband engineering and boundary conditions IEEE Trans. Nanotechnology 2 135-43
    • (2003) IEEE Trans. Nanotechnology , vol.2 , Issue.3 , pp. 135-143
    • Venugopal, R.1    Ren, Z.2    Lundstrom, M.3
  • 27
    • 6244304433 scopus 로고
    • Tunneling in a finite superlattice
    • Tsu R and Esaki L 1973 Tunneling in a finite superlattice Appl. Phys. Lett. 22 562-4
    • (1973) Appl. Phys. Lett. , vol.22 , Issue.11 , pp. 562-564
    • Tsu, R.1    Esaki, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.