Intrinsic leakage in deep submicron CMOS ICs - measurement-based test solutions

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 8, Issue 6, 2000, Pages 717-723

  Keshavarzi, Ali ^a,b   Roy, Kaushik ^a,c   Hawkins, Charles F ^d  

^a IEEE

^b INTEL CORPORATION   (United States)

^c PURDUE UNIVERSITY   (United States)

^d University of New Mexico   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC FIELD EFFECTS; ELECTRIC POWER SUPPLIES TO APPARATUS; HETEROJUNCTIONS; INTEGRATED CIRCUIT TESTING; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; SEMICONDUCTOR DIODES; THRESHOLD VOLTAGE;

DEEP SUBMICRON CMOS INTEGRATED CIRCUITS; QUIESCENT POWER SUPPLY CURRENT; TRANSISTOR INTRINSIC LEAKAGE;

CMOS INTEGRATED CIRCUITS;

EID: 0034459843     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.902266     Document Type: Article

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