Pattern guided structure formation in polymer films of asymmetric blends

Surface Science

Volumn 600, Issue 5, 2006, Pages 1004-1011

  Raczkowska, J ^a   Bernasik, A ^a,b   Budkowski, A ^a   Cyganik, P ^a   Rysz, J ^a   Raptis, I ^c   Czuba, P ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^c INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

Atomic force microscopy; Pattern replication; Polymer films; Self assembly; Soft lithography; Thin film structures

Indexed keywords

ATOMIC FORCE MICROSCOPY; MORPHOLOGY; POLYMER BLENDS; SCANNING; SELF ASSEMBLY; SUBSTRATES;

PATTERN REPLICATION; POLYMER FILMS; SOFT-LITHOGRAPHY; THIN FILM STRUCTURES;

PLASTIC FILMS;

EID: 33644626545     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.12.033     Document Type: Article

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