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Volumn 81, Issue 18, 1998, Pages 3900-3903

Coupling between phase separation and surface deformation modes in self-organizing polymer blend films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000081024     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.81.3900     Document Type: Article
Times cited : (63)

References (15)
  • 14
    • 85035255360 scopus 로고    scopus 로고
    • (private communication). Film thickness estimated from values obtained from x-ray reflectivity measurements of dPS/PB films cast under similar conditions on silicon substrates
    • H. Gruell (private communication). Film thickness estimated from values obtained from x-ray reflectivity measurements of dPS/PB films cast under similar conditions on silicon substrates.
    • Gruell, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.