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Volumn 539, Issue 1-3, 2003, Pages 129-136
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How to form regular polymer microstructures by surface-pattern-directed dewetting
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Author keywords
Atomic force microscopy; Self assembly; Wetting
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
MICROSTRUCTURE;
MONOLAYERS;
SELF ASSEMBLY;
SILANES;
SURFACE TREATMENT;
WETTING;
DEWETTING;
POLYMERS;
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EID: 0042164431
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(03)00785-4 Document Type: Article |
Times cited : (54)
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References (26)
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