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Volumn 539, Issue 1-3, 2003, Pages 129-136

How to form regular polymer microstructures by surface-pattern-directed dewetting

Author keywords

Atomic force microscopy; Self assembly; Wetting

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSTRUCTURE; MONOLAYERS; SELF ASSEMBLY; SILANES; SURFACE TREATMENT; WETTING;

EID: 0042164431     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00785-4     Document Type: Article
Times cited : (54)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.