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Vacuum

Volumn 63, Issue 1-2, 2001, Pages 307-313

Phase decomposition in polymer blend films cast on substrates patterned with self-assembled monolayers

(9) Cyganik, P a Bernasik, A b Budkowski, A a Bergues, B a Kowalski, K b Rysz, J a Lekki, J c Lekka, M c Postawa, Z a

a JAGIELLONIAN UNIVERSITY (Poland)

b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY (Poland)

c INSTITUTE OF NUCLEAR PHYSICS (Poland)

Author keywords

Atomic force microscopy; Phase separation morphology; Polymer blends; Secondary ion mass spectroscopy; Self assembled monolayers; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; DECOMPOSITION; MORPHOLOGY; PHASE SEPARATION; PLASTICS CASTING; POLYMER BLENDS; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY; SUBSTRATES; THIN FILMS;

POLYVINYLPYRIDINE;

PLASTIC FILMS;

EID: 0035797039 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/S0042-207X(01)00206-8 Document Type: Conference Paper

Times cited : (50)

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