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Volumn 36, Issue 7, 2003, Pages 2419-2427

Surface patterns in solvent-cast polymer blend films analyzed with an integral-geometry approach

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; MONOLAYERS; MORPHOLOGY; NUCLEATION; PLASTIC CASTINGS; POLYISOPRENES; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY; SURFACE TOPOGRAPHY; THIN FILMS; TOLUENE;

EID: 0037426547     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma020870w     Document Type: Article
Times cited : (62)

References (64)
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    • 0013250535 scopus 로고    scopus 로고
    • note
    • The morphological measures were calculated for the original representative level contour (for definition see section 3.2) with all the domains smaller than 10% of Λ removed. This procedure practically does not affect either the measure F (see Figure 7) or the threshold height defining the representative level contour.
  • 55
    • 0013264161 scopus 로고
    • Report No. 1690/AP; Institute of Nuclear Physics: Kraków, Poland
    • Lekki, J.; Voss, U.; Sowa, M.; Cleff, B.; Stachura, Z. Report No. 1690/AP; Institute of Nuclear Physics: Kraków, Poland, 1995.
    • (1995)
    • Lekki, J.1    Voss, U.2    Sowa, M.3    Cleff, B.4    Stachura, Z.5
  • 58
    • 0026107359 scopus 로고
    • Bates, F. S. Science 1991, 251, 898-905.
    • (1991) Science , vol.251 , pp. 898-905
    • Bates, F.S.1
  • 59
    • 11844276196 scopus 로고
    • Tanaka, H. Phys. Rev. E 1995, 1313-1329 and references therein.
    • (1995) Phys. Rev. E , vol.51 , pp. 1313-1329
    • Tanaka, H.1
  • 63
    • 0013198326 scopus 로고    scopus 로고
    • note
    • For 0.25 ≤ Φ ≤ 0.45, small-scale (secondary) structures are neglected to exclude any effects of bimodal lateral length distribution.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.