Future memory technology including emerging new memories

Proceedings of the International Conference on Microelectronics

Volumn 24 I, Issue , 2004, Pages 377-384

  Kim, Kinam ^a   Koh, Gwan Hyeob ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA REDUCTION; ENERGY UTILIZATION; FLASH MEMORY; PHASE CHANGING CIRCUITS; STATIC RANDOM ACCESS STORAGE; TECHNOLOGICAL FORECASTING;

CELL ARRAYS; CELL DIMENSIONS; JUNCTION BOUNDARIES;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 3142723223     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)

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