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Volumn 497, Issue 1-2, 2006, Pages 77-82

Exploiting volatile lead compounds as precursors for the atomic layer deposition of lead dioxide thin films

Author keywords

Atomic layer deposition; Deposition process; Lead dioxide; Surface morphology

Indexed keywords

ANNEALING; DEPOSITION; FILM GROWTH; MORPHOLOGY; SILICON; SURFACES; THIN FILMS; X RAY DIFFRACTION;

EID: 30344433453     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.09.188     Document Type: Article
Times cited : (12)

References (48)
  • 48
    • 30344434291 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards, JCPDS, International Center for Diffraction Data, Newton Square, Pennsylvania, USA, cards 25-447 and 37-517
    • Joint Committee on Powder Diffraction Standards, JCPDS, International Center for Diffraction Data, Newton Square, Pennsylvania, USA, cards 25-447 and 37-517.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.