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Volumn 19, Issue 6, 2001, Pages 2870-2878
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Structural and optical properties of thin lead oxide films produced by reactive direct current magnetron sputtering
a,b c a a a b a,d
b
ANNA UNIVERSITY
(India)
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTALLINE MATERIALS;
DIELECTRIC FILMS;
ENERGY GAP;
LEAD COMPOUNDS;
LIGHT REFLECTION;
MAGNETRON SPUTTERING;
RAMAN SPECTROSCOPY;
REFRACTIVE INDEX;
X RAY DIFFRACTION ANALYSIS;
CRYSTALLINE FILMS;
REACTIVE DIRECT CURRENT (DC) MAGNETRON SPUTTERING;
THIN FILMS;
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EID: 0035508719
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1410948 Document Type: Article |
Times cited : (54)
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References (33)
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