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Volumn 19, Issue 6, 2001, Pages 2870-2878

Structural and optical properties of thin lead oxide films produced by reactive direct current magnetron sputtering

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; DIELECTRIC FILMS; ENERGY GAP; LEAD COMPOUNDS; LIGHT REFLECTION; MAGNETRON SPUTTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; X RAY DIFFRACTION ANALYSIS;

EID: 0035508719     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1410948     Document Type: Article
Times cited : (54)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.