메뉴 건너뛰기




Volumn 28, Issue 3, 2004, Pages 329-337

A surface motor-driven planar motion stage integrated with an XYθZ surface encoder for precision positioning

Author keywords

Planar motion stage; Precision positioning; Surface encoder; Surface motor

Indexed keywords

ELECTRIC MOTORS; INTERFEROMETRY; PRECISION ENGINEERING; PRESSURE EFFECTS; STATORS; TEMPERATURE MEASUREMENT;

EID: 2942711839     PISSN: 01416359     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.precisioneng.2003.12.003     Document Type: Article
Times cited : (162)

References (31)
  • 1
    • 0024700992 scopus 로고
    • Dynamic position measurement technique for flash-on-the-fly wafer exposure
    • Stevenson J.T.M., Jordan J.R. Dynamic position measurement technique for flash-on-the-fly wafer exposure. Precision Eng. 11(3):1989;127-133.
    • (1989) Precision Eng. , vol.11 , Issue.3 , pp. 127-133
    • Stevenson, J.T.M.1    Jordan, J.R.2
  • 2
    • 0033272920 scopus 로고    scopus 로고
    • XY stage driven ultrasonic linear motors for the electron-beam x-ray mask writer EB-X3
    • Kunioka T, Takeda Y, Matsuda T. XY stage driven ultrasonic linear motors for the electron-beam x-ray mask writer EB-X3. J Vac Sci Technol B 1999;17(6):2917-20.
    • (1999) J Vac Sci Technol B , vol.17 , Issue.6 , pp. 2917-2920
    • Kunioka, T.1    Takeda, Y.2    Matsuda, T.3
  • 4
    • 0037378359 scopus 로고    scopus 로고
    • Incline compensation control using an air-spring type active isolated apparatus
    • Wakui S. Incline compensation control using an air-spring type active isolated apparatus. Precision Eng. 27(2):2003;170-174.
    • (2003) Precision Eng. , vol.27 , Issue.2 , pp. 170-174
    • Wakui, S.1
  • 5
    • 0028465783 scopus 로고
    • A surface motor-driven precision positioning system
    • Tomita Y., Koyanagawa Y., Satoh F. A surface motor-driven precision positioning system. Precision Eng. 16(3):1994;184-191.
    • (1994) Precision Eng. , vol.16 , Issue.3 , pp. 184-191
    • Tomita, Y.1    Koyanagawa, Y.2    Satoh, F.3
  • 6
    • 0032041169 scopus 로고    scopus 로고
    • High-precision magnetic levitation stage for photolithography
    • Kim W.J., Trumper D.L. High-precision magnetic levitation stage for photolithography. Precision Eng. 22(2):1998;66-77.
    • (1998) Precision Eng. , vol.22 , Issue.2 , pp. 66-77
    • Kim, W.J.1    Trumper, D.L.2
  • 7
    • 0033157058 scopus 로고    scopus 로고
    • Investigation of a 2-D planar motor based machine tool motion system
    • Soltz M.A., Yao Y.L., Ish-Shalom J. Investigation of a 2-D planar motor based machine tool motion system. Int. J. Machine Tools Manufact. 39:1999;1157-1169.
    • (1999) Int. J. Machine Tools Manufact. , vol.39 , pp. 1157-1169
    • Soltz, M.A.1    Yao, Y.L.2    Ish-Shalom, J.3
  • 8
    • 0034223812 scopus 로고    scopus 로고
    • The long-range scanning stage: A novel platform for scanned-probe microscopy
    • Holmes M., Hocken R., Trumper D. The long-range scanning stage: a novel platform for scanned-probe microscopy. Precision Eng. 24(3):2000;191-209.
    • (2000) Precision Eng. , vol.24 , Issue.3 , pp. 191-209
    • Holmes, M.1    Hocken, R.2    Trumper, D.3
  • 9
    • 0033715529 scopus 로고    scopus 로고
    • Ultra-precision 6-axis table driven by means of walking drive
    • Shamoto E., Murase H., Moriwaki T. Ultra-precision 6-axis table driven by means of walking drive. Ann. CIRP. 49(1):2000;299-302.
    • (2000) Ann. CIRP , vol.49 , Issue.1 , pp. 299-302
    • Shamoto, E.1    Murase, H.2    Moriwaki, T.3
  • 10
    • 0034963732 scopus 로고    scopus 로고
    • Dynamics and control of the UNCC/MIT sub-atomic measuring machine
    • Hocken R., Trumper D., Wang C. Dynamics and control of the UNCC/MIT sub-atomic measuring machine. Ann. CIRP. 50(1):2001;373-376.
    • (2001) Ann. CIRP , vol.50 , Issue.1 , pp. 373-376
    • Hocken, R.1    Trumper, D.2    Wang, C.3
  • 11
    • 0027873345 scopus 로고
    • Scales vs laser interferometers, performance and comparison of two measuring systems
    • Kunzmann H., Pfeifer T., Flugge J. Scales vs laser interferometers, performance and comparison of two measuring systems. Ann. CIRP. 42-2:1993;753-767.
    • (1993) Ann. CIRP , vol.42 , Issue.2 , pp. 753-767
    • Kunzmann, H.1    Pfeifer, T.2    Flugge, J.3
  • 12
    • 0006915066 scopus 로고
    • Technology and applications of grating interferometers in high-precision measurement
    • Teimel A. Technology and applications of grating interferometers in high-precision measurement. Precision Eng. 14(3):1992;147-154.
    • (1992) Precision Eng. , vol.14 , Issue.3 , pp. 147-154
    • Teimel, A.1
  • 13
    • 0024984335 scopus 로고
    • Sub-micron position measurement and control on precision machine tools with laser interferometry
    • Steinmetz C.R. Sub-micron position measurement and control on precision machine tools with laser interferometry. Precision Eng. 12(1):1990;12-24.
    • (1990) Precision Eng. , vol.12 , Issue.1 , pp. 12-24
    • Steinmetz, C.R.1
  • 14
    • 0033100502 scopus 로고    scopus 로고
    • An angle-based position detection method for precision machines (1999)
    • Kiyono S., Cai P., Gao W. An angle-based position detection method for precision machines (1999). JSME Int. J. 42(1):1999;44-48.
    • (1999) JSME Int. J. , vol.42 , Issue.1 , pp. 44-48
    • Kiyono, S.1    Cai, P.2    Gao, W.3
  • 15
    • 0042844557 scopus 로고    scopus 로고
    • Precision measurement of two-axis positions and tilt motions using a surface encoder
    • Gao W., Dejima S., Shimizu Y., Kiyono S. Precision measurement of two-axis positions and tilt motions using a surface encoder. Ann. CIRP. 52(1):2003;435-438.
    • (2003) Ann. CIRP , vol.52 , Issue.1 , pp. 435-438
    • Gao, W.1    Dejima, S.2    Shimizu, Y.3    Kiyono, S.4
  • 16
    • 0000215664 scopus 로고
    • Design and testing of a fast tool servo for diamond turning
    • Patterson S.R., Magrab E.B. Design and testing of a fast tool servo for diamond turning. Precision Eng. 7(3):1985;123-128.
    • (1985) Precision Eng. , vol.7 , Issue.3 , pp. 123-128
    • Patterson, S.R.1    Magrab, E.B.2
  • 17
    • 0026239438 scopus 로고
    • Application of a fast tool servo for diamond turning of nonrotationally symmetric surfaces
    • Dow T.A., Miller M.H., Falter P.J. Application of a fast tool servo for diamond turning of nonrotationally symmetric surfaces. Precision Eng. 13(4):1991;233-250.
    • (1991) Precision Eng. , vol.13 , Issue.4 , pp. 233-250
    • Dow, T.A.1    Miller, M.H.2    Falter, P.J.3
  • 18
    • 0041899249 scopus 로고    scopus 로고
    • Fast tool servo system and its application to three dimensional fine figures
    • St. Louis, Missouri, October 25-30
    • Okazaki Y. Fast tool servo system and its application to three dimensional fine figures. Proc 13th ASPE, St. Louis, Missouri, October 25-30, 1998:100-3.
    • (1998) Proc 13th ASPE , pp. 100-103
    • Okazaki, Y.1
  • 19
    • 0032645854 scopus 로고    scopus 로고
    • Design of a rotary fast tool servo for ophthalmic lens fabrication
    • Ludwick S.J., Chargin D.A., Calzaretta J.A., Trumper D.L. Design of a rotary fast tool servo for ophthalmic lens fabrication. Precision Eng. 23(4):1999;253-259.
    • (1999) Precision Eng. , vol.23 , Issue.4 , pp. 253-259
    • Ludwick, S.J.1    Chargin, D.A.2    Calzaretta, J.A.3    Trumper, D.L.4
  • 21
    • 0042745544 scopus 로고    scopus 로고
    • Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder
    • Gao W., Araki T., Kiyono S., Okazaki Y., Yamanaka M. Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder. Precision Eng. 27(3):2003;289-298.
    • (2003) Precision Eng. , vol.27 , Issue.3 , pp. 289-298
    • Gao, W.1    Araki, T.2    Kiyono, S.3    Okazaki, Y.4    Yamanaka, M.5
  • 22
    • 0033731580 scopus 로고    scopus 로고
    • A new 3-DOF Z-tilts micropositioning system using electromagnetic actuators and air bearings
    • Lee S.Q., Gweon D.G. A new 3-DOF Z-tilts micropositioning system using electromagnetic actuators and air bearings. Precision Eng. 24(1):2000;24-31.
    • (2000) Precision Eng. , vol.24 , Issue.1 , pp. 24-31
    • Lee, S.Q.1    Gweon, D.G.2
  • 24
    • 0019899439 scopus 로고
    • High accuracy profile measurement of quasi-conical mirror surfaces by laser autocollimation
    • Ennos A.E., Virdee M.S. High accuracy profile measurement of quasi-conical mirror surfaces by laser autocollimation. Precision Eng. 4-1:1982;5-8.
    • (1982) Precision Eng. , vol.4 , Issue.1 , pp. 5-8
    • Ennos, A.E.1    Virdee, M.S.2
  • 25
    • 0030234365 scopus 로고    scopus 로고
    • A new multiprobe method of roundness measurements
    • Gao W., Kiyono S., Nomura T. A new multiprobe method of roundness measurements. Precision Eng. 19(1):1996;55-64.
    • (1996) Precision Eng. , vol.19 , Issue.1 , pp. 55-64
    • Gao, W.1    Kiyono, S.2    Nomura, T.3
  • 26
    • 0000347564 scopus 로고    scopus 로고
    • Development of an optical probe for profile measurement of mirror surface
    • Gao W., Kiyono S. Development of an optical probe for profile measurement of mirror surface. Opt. Eng. 36(12):1997;3360-3366.
    • (1997) Opt. Eng. , vol.36 , Issue.12 , pp. 3360-3366
    • Gao, W.1    Kiyono, S.2
  • 27
    • 0033343741 scopus 로고    scopus 로고
    • Novel scanning technique for ultra-precise measurement of topography
    • Weingartner I., Schulz M., Elster C. Novel scanning technique for ultra-precise measurement of topography. SPIE. 3782:1999;306-317.
    • (1999) SPIE , vol.3782 , pp. 306-317
    • Weingartner, I.1    Schulz, M.2    Elster, C.3
  • 28
    • 0037501160 scopus 로고    scopus 로고
    • Precision measurement of multi-degree-of-freedom spindle errors using two-dimensional slope sensors
    • Gao W., Kiyono S., Satoh E. Precision measurement of multi-degree-of- freedom spindle errors using two-dimensional slope sensors. Ann. CIRP. 51(1):2002;447-450.
    • (2002) Ann. CIRP , vol.51 , Issue.1 , pp. 447-450
    • Gao, W.1    Kiyono, S.2    Satoh, E.3
  • 29
    • 0036776394 scopus 로고    scopus 로고
    • A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers
    • Gao W., Huang P.S., Yamada T., Kiyono S. A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers. Precision Eng. 26(4):2002;396-404.
    • (2002) Precision Eng. , vol.26 , Issue.4 , pp. 396-404
    • Gao, W.1    Huang, P.S.2    Yamada, T.3    Kiyono, S.4
  • 30
    • 0030694908 scopus 로고    scopus 로고
    • An exact algorithm for self-calibration of two-dimensional precision metrology stages
    • Ye J., Takac M., Berglund C.N., Owen G., Pease R.F. An exact algorithm for self-calibration of two-dimensional precision metrology stages. Precision Eng. 20:1997;16-32.
    • (1997) Precision Eng. , vol.20 , pp. 16-32
    • Ye, J.1    Takac, M.2    Berglund, C.N.3    Owen, G.4    Pease, R.F.5
  • 31
    • 0034296618 scopus 로고    scopus 로고
    • Self-calibration of a scanning white light interference microscope
    • Kiyono S., Gao W., Zhang S., Aramaki T. Self-calibration of a scanning white light interference microscope. Opt. Eng. 39(10):2000;2720-2725.
    • (2000) Opt. Eng. , vol.39 , Issue.10 , pp. 2720-2725
    • Kiyono, S.1    Gao, W.2    Zhang, S.3    Aramaki, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.