In situ transmission electron microscopy investigation of threading dislocation motion in passivated thin aluminum films

Journal of Materials Research

Volumn 14, Issue 12, 1999, Pages 4673-4676

  Keller Flaig, R M ^a   Legros, M ^b   Sigle, W ^c   Gouldstone, A ^d   Hemker, K J ^e   Suresh, S ^d   Arzt, E ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b Parc de Saurupt   (France)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^d Department of Civil and Environmental Engineering   (United States)

^e Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); PASSIVATION; SILICA; STRENGTH OF MATERIALS; SUBSTRATES; THERMAL CYCLING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

THREADING DISLOCATIONS;

METALLIC FILMS;

EID: 0033335009     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0632     Document Type: Article

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