CrB2 Schottky barrier contacts on n-GaN

Journal of the Electrochemical Society

Volumn 152, Issue 11, 2005, Pages

  Khanna, Rohit ^a   Pearton, S J ^a,c   Ren, F ^a,c   Kravchenko, I ^b  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^b University of Florida   (United States)

^c ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CHROMIUM COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION; ELECTRIC BREAKDOWN; GALLIUM NITRIDE; GOLD; METALLIZING; POWER AMPLIFIERS; SCANNING ELECTRON MICROSCOPY; THERMODYNAMIC STABILITY;

ANNEAL TEMPERATURE; ELEMENTAL PROFILE; SCHOTTKY BARRIER CONTACTS; SCHOTTKY BARRIER HEIGHT;

ELECTRIC CONTACTS;

EID: 27944434968     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2039933     Document Type: Article

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