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Applied Physics A: Materials Science and Processing

Volumn 81, Issue 8, 2005, Pages 1619-1625

Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers

(1) MacDonald, D a

a AUSTRALIAN NATIONAL UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; COOLING; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; OXIDATION; SILICON WAFERS;

INJECTION-DEPENDENT LIFETIME CURVES; NICKEL CONTAMINATION; SURFACE CONTAMINATION;

NICKEL;

EID: 27244458624 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-005-3371-5 Document Type: Article

Times cited : (16)

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