Sharpened carbon nanotube probes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4098, Issue , 2000, Pages 76-83

  Moloni, Katerina ^a   Lal, Amit ^a   Lagally, Max ^a  

^a Piezomax Technologies   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; MICROSCOPIC EXAMINATION; MORPHOLOGY;

CARBON NANOTUBE TIPS (CNT);

NANOTUBES;

EID: 0033650371     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)