Influence of force acting on side face of carbon nanotube in atomic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 6 B, 2000, Pages 3724-3727

  Akita, Seiji ^a   Nishuima, Hidehiro ^a   Kishida, Takayoshi ^a   Nakayama, Yoshikazu ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Atomic force microscopy; Carbon nanotube; Force curve; Nanomechanics; Young's modulus

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; BUCKLING; CARBON; ELASTIC MODULI; FRICTION; MAGNETIC DISK STORAGE; SCANNING ELECTRON MICROSCOPY;

DIGITAL VERSATILE DISKS (DVD); FORCE CURVE MEASUREMENT; NANOMECHANICS;

NANOTUBES;

EID: 0034205187     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3724     Document Type: Article

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