Complex dynamics of carbon nanotube probe tips

Ultramicroscopy

Volumn 103, Issue 2, 2005, Pages 95-102

  Lee, S I ^a,d   Howell, S W ^a,e   Raman, A ^a   Reifenberger, R ^a   Nguyen, C V ^b,c   Meyyappan, M ^b  

^a PURDUE UNIVERSITY   (United States)

^b NASA AMES RESEARCH CENTER   (United States)

^c ELORET CORPORATION   (United States)

^d University of Seoul   (South Korea)

^e SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Atomic force microscopes; Carbon nanotubes; Nonlinear dynamics

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; BUCKLING; FREQUENCY RESPONSE; IMAGING TECHNIQUES; SILICA; SURFACE CLEANING;

HIGH-RESOLUTION IMAGING; IMAGING INSTABILITIES; MULTI-WALLED CARBON NANOTUBES; PROBE TIPS;

CARBON NANOTUBES;

CARBON NANOTUBE; NANOTUBE; SILICON DIOXIDE;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGING; MEASUREMENT; MOLECULAR DYNAMICS; SCANNING ELECTRON MICROSCOPY;

SIO;

EID: 14844349996     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.09.012     Document Type: Article

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