The impact of high-k dielectrics in nanocrystal flash memories

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 5732, Issue , 2005, Pages 547-555

  Freire, V N ^a   De Sousa, J S ^a  

^a FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

Author keywords

High k dielectrics; Quantum dots; Single electron tunneling

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRONIC PROPERTIES; MOSFET DEVICES; NANOSTRUCTURED MATERIALS; QUANTUM THEORY; SEMICONDUCTOR QUANTUM DOTS;

COULOMB BLOCKADE ENERGY; HIGH-K DIELECTRICS; SINGLE ELECTRON TUNNELING; SOURCE-TO-DRAIN CURRENTS;

FLASH MEMORY;

EID: 21844465367     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.588362     Document Type: Conference Paper

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