Force spectroscopy with a large dynamic range using small cantilevers and an array detector

Journal of Applied Physics

Volumn 91, Issue 7, 2002, Pages 4739-4746

  Schäffer, Tilman E ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAY DETECTORS; ATOMIC FORCE MICROSCOPE (AFM); BEAM SHIFT; CANTILEVER DEFLECTION; CURVED MIRROR; DETECTION LIMITS; DETECTION SETUP; DYNAMIC RANGE; FORCE SENSING; FORCE SPECTROSCOPY; HIGH SENSITIVITY; IRRADIANCE DISTRIBUTION; LIGHT BEAM REFLECTED; LINEAR ARRANGEMENTS; LINEAR FUNCTIONS; NON-LINEARITY; REFLECTED BEAM; SMALL CANTILEVERS;

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS;

DETECTORS;

EID: 84861432606     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1450258     Document Type: Article

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