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Volumn 47, Issue 11-12, 2002, Pages 775-783

Polymer studies using Atomic Force Microscopy (AFM). Part I. Principles of AFM and its application in polymer morphology investigations;Badania polimerów z wykorzystaniem metody Mikroskopii Sił Atomowych (AFM). Cz. I. Podstawy AFM I jej zastosowanie w badaniach morfologii polimerów

Author keywords

Atomic Force Microscopy (AFM); Copolymer structure; Geometric structure of polymer surface; Morphology; Nanostructures; Polymer blends; Roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; POLYMER BLENDS; POLYMERS;

EID: 18144446432     PISSN: 00322725     EISSN: None     Source Type: Journal    
DOI: 10.14314/polimery.2002.775     Document Type: Article
Times cited : (4)

References (89)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.