The principles of atomic force microscopy in polymer studies;Podstawy mikroskopii sił atomowych w badaniach polimerów

Polimery/Polymers

Volumn 44, Issue 7-8, 1999, Pages 520-532

  Zenkiewicz, Marian ^a   Polański, Julian ^b  

^a Instytut Inzynierii Materiałow Polimerowych i Barwnikow Torun   (Poland)

^b UNIVERSITY OF TECHNOLOGY AND LIFE SCIENCES   (Poland)

Author keywords

Applications; Atomic force microscope (AFM); Design; Error sources; Research limitations; Types of interactions examined; Work system

Indexed keywords

EID: 0000334406     PISSN: 00322725     EISSN: None     Source Type: Journal    
DOI: 10.14314/polimery.1999.520     Document Type: Article

References (59)

1. Binning C. i in.: Phys. Rev. Lett. 1986, 56, 930.
2. Binning C, Rohrer H.: Helv. Phys. Acta 1982, 55, 727.
3. Prater C. B. i in.: "Probing Nano-Scale Forces with the Atomic Force Microscope", "Digital Instruments", Santa Barbara 1995.
4. Cleveland J. P. i in.: Rev. Sci. Instrum. 1993, 64, 403.
5. Butt H. J. i in,: J. Microsc. 1993, 169, 75.
6. Senden T. J. i in.: Langmuir 1994, 10, 1003.
7. Smith S. T., Howard L. P.: Rev. Sci. Instrum. 1994, 65, 903.
8. Sader J. E., White L.: J. Appl. Phys. 1993, 74, 1.
9. Neumeister J. M., Drucker W. A.: Rev. Sci. Instrum. 1994, 65, 2527.
10. Albrecht T. R., Quate C. F: J. Appl. Phys. 1987, 62, 2599.
11. Marti O. i in.: Appl. Phys. Lett. 1987, 51, 484.
12. Meyer E. i in.: J. Microscopy 1988, 151, 269.
13. Kirk M. O. i in.: Rev. Sci. Instrum. 1988, 59, 833,
14. Giessibl F. J., Binning C.: Utramicroscopy 1992, 42-44, 281.
15. Miller G. L. i in.: Rev. Sci. Instrum. 1990, 61, 1267.
16. Neubauer G. i in.: Rev. Sci. Instrum. 1990, 61, 2296.
17. Meyer G., Amer N.: Appl. Phys. Lett 1988, 53, 1054.
18. Meyer G., Amer N.: Appl. Phys. Lett. 1990, 57, 2089.
19. Sarid D., Ellings V.: J. Vac. Sci. Technol. 1991, B9, 431.
20. "Spektroskopia ciała stałego" (red. Drozdowski M.), Wydawnictwo Politechniki Poznańskiej, Poznań 1996.
21. Strausser Y. E., Heaton M. G.: "Scanning Probe Microscopy: Technology Overview", "Digital Instruments", Santa Barbara 1997.
22. Zenkiewicz M.: Projekt badawczy Nr 7T08E 004 13 (nie publ), 1999.
23. Magonov S. N., Whangho M. H.: "Suface Analysis with STM and AFM", VCH, Weinheim 1996.
24. Hartmann U.: Phys. Rev. 1990, B42, 1541.
25. Goodmann F. O., Garcia N.: Phys. Rev. 1991, B43, 4728.
26. Wen H. i in.: J. Vac. Sci. Technol. 1991, B9, 926.
27. Mayer E.: Progress Surf. Sci. 1992, 41, 3.
28. Stern J. E. i in.: Appl. Phys. Lett. 1998, 53, 2717.
29. Terris D. i in.: Phys. Rev. Lett. 1989, 63, 2669.
30. Butt H. J.: Biophys. J. 1992, 63, 578.
31. Leng Y., Wiliams C. C.: Proc. SPIE - Int. Soc. Opt. Eng., Los Angeles 1993.
32. "Scanning Tunneling Microscopy II, Further Applications and Related Scanning Techniques" (red. Wiesendanger R., Guntherodt H. J.), Springer Verlag, Berlin 1992.
33. Mate C. M. i in.: IEEE Trans. Mag. 1990, 26, 1225.
34. Weinsenhorn A. L. i in.: Appl. Phys. Lett. 1989, 54, 2651.
35. Mate C. M. i in.: J. Chem. Phys. 1989, 90, 7550.
36. Butt H. J. i in.: Bioeletrochem, Bioenergetics 1995, 38, 191.
37. Heaton M. G. i in.: "Lateral and Chemical Force Microscopy: Mapping Surface Friction", "Digital Instruments", Santa Barbara 1995.
38. Frisbie C. D. i in.: Science 1994, 265, 2071.
39. Wendman M. i in.: "Scanning Thermal Microscopy with Nano Scope Scanning Probe Microscopes", "Digital Instruments", Santa Barbara 1997.
40. Landman U. i in.: J. Vac. Sci. Technol. 1989, A7, 2829.
41. Zhong W., Tomanek D.: Phys. Rev. Lett. 1990, 64, 30.
42. Tomanek D. i in.: Europhys. Lett. 1991, 15, 887.
43. Grafstrom S. i in.: Nanotechnology 1993, 4, 143.
44. Wilbrun J. L. i in.: Langmuir 1995, 11, 825.
45. Hangstad G. i in.: Langmuir 1995, 11, 4373.
46. Hansma P. K. i in.: Appl. Phys. Lett. 1994, 64, 1738.
47. Albrecht T. R. i in.: J. Appl. Phys. 1991, 69, 668.
48. Prater C. B. i in.: "Tapping Mode Imaging: Applications and Technology", "Digital Instruments", Santa Barbara 1997.
49. Johnson C. A.: "Tapping Mode AFM Imaging in Fluids for the Study of Colloidal Particle Adsorption", "Digital Instruments", Santa Barbara 1995.
50. Babcock K. L., Prater C. B.: "Phase Imaging: Beyond Topography", "Digital Instruments", Santa Barbara 1995.
51. Schmitt C. C., Elings J. R.: "Nanoindenting Seratching and Wear Testing Using Scanning Probe Microscopy", "Digital Instruments", Santa Barbara 1996.
52. Maivald P. i in.: Nanotechnology 1991, 2, 103.
53. Heaton M. G. i in.: "Force Modulation Imaging", "Digital Instruments", Santa Barbara 1995.
54. Babcock K. "Magnetic Force Microscopy: High Resolution for Data Storage", "Digital Instruments", Santa Barbara 1994.
55. Grutter P.: MSA Bull 1994, 24, 416.
56. Schonenberger C. i in.: J. Appl. Phys. 1990, 67, 12.
57. Materiały Katalogowe: "Nano Scope Products", "Digital Instruments", Santa Barbara 1998.
58. Mosley J. L, Heaton M. G.: "Tip Evaluation Option for Nano Scope Atomic Force Microscope", "Digital Instruments", Santa Barbara 1998.
59. Schaefer D. M. i in.: J. Adhesion Sci. Technol 1995, 9, 1049.