Lamellar period in symmetric diblock copolymer thin films studied by neutron reflectivity and AFM

Applied Surface Science

Volumn 142, Issue 1, 1999, Pages 608-613

  Gadegaard, Nikolaj ^a   Almdal, Kristoffer ^a   Larsen, Niels Bent ^a   Mortensen, Kell ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; MOLECULAR WEIGHT; MORPHOLOGY; NEUTRON REFLECTION; SURFACES; TEMPERATURE;

BRAGG PEAK; NEUTRON REFLECTIVITY; POLYETHYLENE ALT PROPYLENE BLOCK DIMETHYSILOXANE; SMALL ANGLE NEUTRON SCATTERING;

THIN FILMS;

EID: 0032662596     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00697-7     Document Type: Article

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