Details of surface features in aromatic polyamide reverse osmosis membranes characterized by scanning electron and atomic force microscopy

Journal of Polymer Science, Part B: Polymer Physics

Volumn 37, Issue 13, 1999, Pages 1429-1440

  Kwak, Seung Yeop ^a   Jung, Soo Gyung ^a   Yoon, Young Seo ^b   Ihm, Dae Woo ^b  

^a Seoul National University   (South Korea)

^b R and D Center   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC POLYMERS; ATOMIC FORCE MICROSCOPY; CROSSLINKING; MECHANICAL PERMEABILITY; MORPHOLOGY; OSMOSIS MEMBRANES; PLASTIC FILMS; POLYAMIDES; REVERSE OSMOSIS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; THIN FILMS;

THIN FILM COMPOSITES (TFC);

POLYMERIC MEMBRANES;

EID: 0032656886     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-0488(19990701)37:13<1429::AID-POLB9>3.0.CO;2-B     Document Type: Article

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