메뉴 건너뛰기




Volumn 109, Issue 23, 1998, Pages 10111-10114

Defect evolution in ultrathin films of polystyrene-block-polymethylmethacrylate diblock copolymers observed by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001573951     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.477702     Document Type: Article
Times cited : (98)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.