Software-based self-testing of embedded processors

IEEE Transactions on Computers

Volumn 54, Issue 4, 2005, Pages 461-475

  Kranitis, Nektarios ^a   Paschallis, Antonis ^a   Gizopoulos, Dimitris ^b   Xenoulis, George ^b  

^a UNIVERSITY OF ATHENS   (Greece)

^b UNIVERSITY OF PIRAEUS   (Greece)

Author keywords

Embedded processors; Low cost testing; Processor self testing; Software based self testing

Indexed keywords

BUILT-IN SELF TEST; COMPUTER SOFTWARE; COMPUTER TESTING; EMBEDDED SYSTEMS; FAULT TOLERANT COMPUTER SYSTEMS; REDUCED INSTRUCTION SET COMPUTING;

EMBEDDED PROCESSORS; LOW COST TESTING; PROCESSOR SELF TESTING; SOFTWARE BASED SELF TESTING;

MICROPROCESSOR CHIPS;

EID: 17644398178     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2005.68     Document Type: Article

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