Correlated topographic and spectroscopic imaging by combined atomic force microscopy and optical microscopy

Journal of Luminescence

Volumn 107, Issue 1-4, 2004, Pages 4-12

  Hu, Dehong ^a   Micic, Miodrag ^a   Klymyshyn, Nicholas ^a   Suh, Yung Doug ^a   Lu, H Peter ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Atomic force microscopy; Fluorescence lifetime imaging

Indexed keywords

ATOMIC FORCE MICROSCOPY; CELLS; COMPUTER SIMULATION; FINITE ELEMENT METHOD; FLUORESCENCE; LIGHTING; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; PROTEINS; SCANNING; SPECTROSCOPIC ANALYSIS;

LIFETIME IMAGING; NANOSCALE SYSTEMS;

IMAGING TECHNIQUES;

EID: 1642603041     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2003.12.045     Document Type: Conference Paper

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