Probing nanoscale surface enhanced Raman-scattering fluctuation dynamics using correlated AFM and confocal ultramicroscopy

Ultramicroscopy

Volumn 97, Issue 1-4, 2003, Pages 89-102

  Suh, Yung Doug ^a   Schenter, Gregory K ^a   Zhu, Leyun ^a   Lu, H Peter ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

AFM; SERS; Single molecule spectroscopy; Single particle spectroscopy; Spectral fluctuation dynamics

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CORRELATION METHODS; DIFFRACTION; DIFFUSION; LASER BEAM EFFECTS; MONOLAYERS; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; SILVER;

IMAGING MICROSCOPY;

RAMAN SCATTERING;

CYTOCHROME C; NANOPARTICLE; RHODAMINE 6G; SILVER;

ANALYTIC METHOD; ANALYTICAL PARAMETERS; ARTICLE; ATOMIC FORCE MICROSCOPY; CLUSTER ANALYSIS; CONFOCAL ULTRAMICROSCOPY; CORRELATION ANALYSIS; DIFFUSION; DYNAMICS; ELECTROMAGNETIC FIELD; ENZYME ANALYSIS; GEOMETRY; LASER; LIGHT; MICROSCOPY; MOLECULAR INTERACTION; MOLECULAR MECHANICS; RAMAN SPECTROMETRY; SIGNAL PROCESSING; SIMULATION; SURFACE PROPERTY;

EID: 0038542827     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00033-0     Document Type: Article

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