Combined force and photonic probe microscope with single molecule sensitivity

Review of Scientific Instruments

Volumn 74, Issue 3 I, 2003, Pages 1217-1221

  Noy, Aleksandr ^a   Huser, Thomas R ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LASER APPLICATIONS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHOTONS;

PHOTONIC PROBE MICROSCOPES;

IMAGING TECHNIQUES;

EID: 0037350177     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1536260     Document Type: Article

References (23)

1. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).
2. C. Quate, Surf. Sci. 299/300, 980 (1994).
3. N. Burnham, A. Kulik, F. Oulevey, C. Mayencourt, D. Gourdon, E. Dupas, and G. Gremaud, in Micro/Nanotribology and its Applications, edited by B. Bhushan (Kluwer Academic. The Netherlands, 1997), pp. 421-453.
4. S. Magonov and M.-H. Whangbo, Surface Analysis with STM and AFM (WCH, Weinheim, 1996).
5. M. Hipp, H. Bielefeldt, J. Colchero, O. Marti, and J. Mlynek, Ultramicroscopy 42, 1498 (1992).
6. O. Marti, J. Colchero, and J. Mlynek, Nanotechnology l, 141 (1990).
7. R. M. Overney, E. Meyer, J. Frommer, H.-J. Guntherodt, M. Fujihira, H. Takano, and Y. Gotoh, Langmuir 10, 1281 (1994).
8. A. Noy, D. Vezenov, and C. Lieber, Annu. Rev. Mater. Sci. 27, 381 (1997).
9. D. A. Chernoff, in Proceedings of Microscopy and Microanalysis, edited by G. W. Bailey, M. H. Ellisman, R. A. Hennigar, and N. J. Zaluzec (Jones and Begell, New York, 1995), p. 888.
10. J. Cleveland, B. Anczykowski, A. Schmidt, and V. Elings, Appl. Phys. Lett. 72, 2613 (1997).
11. B. Anczykowski, D. Kruger, K. Babcock, and H. Fuchs, Ultramicroscopy 66, 251 (1996).
12. A. Noy, C. Sanders, D. Vezenov, S. Wong, and C. Lieber, Langmuir 14, 1508 (1998).
13. J. B. Pawley, Handbook of Biological Confocal Microscopy, 2nd ed. (Plenum, New York, 1995).
14. S. Weiss, Science 283, 1676 (1999).
15. R. C. Dunn, Chem. Rev. 99, 2891 (1999).
16. B. Hecht, H. Bielefeld, Y. Inouye, D. W. Pohl, and L. Novotny, J. Appl. Phys. 81, 2492 (1997).
17. K. Lieberman, N. Ben-Ami, and A. Lewis, Rev. Sci. Instrum. 67, 3567 (1996).
18. G. Meyer and N. M. Amer, Appl. Phys. Lett. 53, 1045 (1988).
19. D. Rugar, H. J. Mamin, P. Guethner, S. E. Lambert, J. E. Stem, I. McFadyen, and T. Yogi, J. Appl. Phys. 68, 1169 (1990).
20. Caution: This operation removes a built-in safety device, therefore, use caution when handling the modified AFM head. Never stare into a laser beam.
21. J. H. Hafner, C. L. Cheung, and C. M. Lieber, Nature (London) 398, 761 (1999).
22. L. W. Chen, K. A. Haushalter, C. M. Lieber, and G. L. Verdine, Chem. Biol. 9, 345 (2002).
23. A. Noy, A. E. Miller, J. E. Klare, B. L. Weeks, B. W. Woods, and J. J. DeYoreo, Nano Lett. 2, 109 (2002).