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Volumn 28, Issue 1, 2005, Pages 70-79

Fast simulation of steady-state temperature distributions in electronic components using multidimensional model reduction

Author keywords

C4 CBGA package; Compact modeling; GaN MESFET; Integrated circuit (IC) component; Multidimensional model reduction; Silicon on insulator (SOI) clock driver; Thermal analysis

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MESFET DEVICES; PARTIAL DIFFERENTIAL EQUATIONS; POWER AMPLIFIERS; SILICON ON INSULATOR TECHNOLOGY; TEMPERATURE DISTRIBUTION; THERMOANALYSIS; THERMODYNAMICS;

EID: 15744401613     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2004.838877     Document Type: Article
Times cited : (13)

References (20)
  • 1
    • 0003552056 scopus 로고    scopus 로고
    • The National Technology Roadmap for Semiconductors
    • SIA, Semiconductor Industry Assoc
    • SIA, The National Technology Roadmap for Semiconductors, Semiconductor Industry Assoc., 1997.
    • (1997)
  • 3
    • 0035691805 scopus 로고    scopus 로고
    • "Challenges in thermal modeling of electronics at the system lavel: Summary of panel held at the Therminic 2000"
    • Dec
    • Y. Joshi, M. Baelmans, D. Copeland, C. J. M. Lasance, J. Parry, and J. Rantal, "Challenges in thermal modeling of electronics at the system lavel: summary of panel held at the Therminic 2000," IEEE Trans. Compon. Packag. Technol., vol. 24, pp. 611-613, Dec. 2001.
    • (2001) IEEE Trans. Compon. Packag. Technol. , vol.24 , pp. 611-613
    • Joshi, Y.1    Baelmans, M.2    Copeland, D.3    Lasance, C.J.M.4    Parry, J.5    Rantal, J.6
  • 4
    • 0031336873 scopus 로고    scopus 로고
    • "Thermal characterization of chip packages-evolutionary development of compact models"
    • Dec
    • A. B. Cohen and B. Krueger, "Thermal characterization of chip packages-evolutionary development of compact models," IEEE Trans. Compon., Packag., Manufact. Technol. A, vol. 20, pp. 399-410, Dec. 1997.
    • (1997) IEEE Trans. Compon., Packag., Manufact. Technol. A , vol.20 , pp. 399-410
    • Cohen, A.B.1    Krueger, B.2
  • 5
    • 0032676548 scopus 로고    scopus 로고
    • "Creation and evaluation of compact models for thermal characterization using dedicated optimization software"
    • C. J. M. Lasance, "Creation and evaluation of compact models for thermal characterization using dedicated optimization software," in Proc. 15th IEEE SEMI-THERM Symp., 1999.
    • (1999) Proc. 15th IEEE SEMI-THERM Symp.
    • Lasance, C.J.M.1
  • 6
    • 0742321743 scopus 로고    scopus 로고
    • "Passive parameterized time-domain macromodels for high-speed transmission-line networks"
    • Dec
    • P. Gunupudi, R. Khazaka, M. Nakhla, T. J. Smy, and D. Celo, "Passive parameterized time-domain macromodels for high-speed transmission-line networks," IEEE Trans. Microwave Theory Tech., vol. 51, pp. 2347-2355, Dec. 2003.
    • (2003) IEEE Trans. Microwave Theory Tech. , vol.51 , pp. 2347-2355
    • Gunupudi, P.1    Khazaka, R.2    Nakhla, M.3    Smy, T.J.4    Celo, D.5
  • 8
    • 0035057299 scopus 로고    scopus 로고
    • "A 3-D thermal simulation tool for integrated devices - Atar"
    • Jan
    • T. Smy, D. Walkey, and S. K. Dew, "A 3-D thermal simulation tool for integrated devices - Atar," IEEE Trans CAD IC Syst., vol. 20, pp. 1-11, Jan. 2001.
    • (2001) IEEE Trans CAD IC Syst. , vol.20 , pp. 1-11
    • Smy, T.1    Walkey, D.2    Dew, S.K.3
  • 9
    • 0035390033 scopus 로고    scopus 로고
    • "Transient 3-D heat flow analysis for integrated circuit devices using transmission line matrix method on a quad tree mesh"
    • Jan
    • T. Smy, D. Walkey, and S. K. Dew, "Transient 3-D heat flow analysis for integrated circuit devices using transmission line matrix method on a quad tree mesh," Solid-State Electron., vol. 45, pp. 1137-1148, Jan. 2001.
    • (2001) Solid-State Electron. , vol.45 , pp. 1137-1148
    • Smy, T.1    Walkey, D.2    Dew, S.K.3
  • 10
    • 0035554944 scopus 로고    scopus 로고
    • "Simulation of local heating in VLSI backand structures using Atar"
    • Montreal, QC, Canada, Oct
    • T. Smy, D. Walkey, M. Shams, and R. V. Joshi, "Simulation of local heating in VLSI backand structures using Atar," in Proc. Advanced Metallization Conf., Montreal, QC, Canada, Oct. 2001, p. 355.
    • (2001) Proc. Advanced Metallization Conf. , pp. 355
    • Smy, T.1    Walkey, D.2    Shams, M.3    Joshi, R.V.4
  • 14
    • 0032139262 scopus 로고    scopus 로고
    • "PRIMA: Passive reduced-order interconnect macromodeling algorithm"
    • Aug
    • A. Odabasioglu, M. Celik, and L. T. Pileggi, "PRIMA: passive reduced-order interconnect macromodeling algorithm," IEEE Trans. Comput. Aided Design, vol. 17, pp. 645-653, Aug. 1998.
    • (1998) IEEE Trans. Comput. Aided Design , vol.17 , pp. 645-653
    • Odabasioglu, A.1    Celik, M.2    Pileggi, L.T.3
  • 16
    • 0033221866 scopus 로고    scopus 로고
    • "A 0.2 um 1.8 V SOI 550 MHz 64 b power PC microprocessor with Cu interconnects"
    • Nov
    • A. G. Aipperspach, D. Allen, D. T. Cox, N. V. Phan, and S. N. Storino, "A 0.2 um 1.8 V SOI 550 MHz 64 b power PC microprocessor with Cu interconnects," IEEE J. Solid-State Circuits, vol. 34, no. 11, pp. 1430-1435, Nov. 1999.
    • (1999) IEEE J. Solid-State Circuits , vol.34 , Issue.11 , pp. 1430-1435
    • Aipperspach, A.G.1    Allen, D.2    Cox, D.T.3    Phan, N.V.4    Storino, S.N.5
  • 17
    • 0035555090 scopus 로고    scopus 로고
    • "High performance SOI/Cu SRAMs and memories in microprocessors"
    • Montreal, QC, Canada, Oct
    • R. V. Joshi, "High performance SOI/Cu SRAMs and memories in microprocessors," in Proc. Advanced Metallization Conf., Montreal, QC, Canada, Oct. 2001, p. 347.
    • (2001) Proc. Advanced Metallization Conf. , pp. 347
    • Joshi, R.V.1
  • 18
    • 0031334642 scopus 로고    scopus 로고
    • "The world of thermal characterization according to DELPHI - Part I: Background to DELPHI"
    • Dec
    • H. Rosten, C. J. M. Lasance, and J. Parry, "The world of thermal characterization according to DELPHI - part I: background to DELPHI," IEEE Trans. Compon., Packag., Manufact. Technol. A, vol. 20, pp. 392-398, Dec. 1997.
    • (1997) IEEE Trans. Compon., Packag., Manufact. Technol. A , vol.20 , pp. 392-398
    • Rosten, H.1    Lasance, C.J.M.2    Parry, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.