Creation and evaluation of compact models for thermal characterization using dedicated optimization software

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 1999, Pages 189-200

  Lasance, Clemens J M ^a   den Hertog, Dick ^a   Stehouwer, Peter ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SOFTWARE; MATHEMATICAL MODELS; OPTIMIZATION;

DEDICATED OPTIMIZATION SOFTWARE; ELECTRONIC PARTS;

ELECTRONICS PACKAGING;

EID: 0032676548     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (24)