Atomic resolution electron energy-loss spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 143, Issue 2-3 SPEC. ISS., 2005, Pages 105-115

  Klie, R F ^a   Arslan, I ^b   Browning, N D ^c  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c University of California Davis   (United States)

Author keywords

Al2O 3; EELS; GaN; HAADF; MgB2; SrTiO3; STEM

Indexed keywords

ALUMINA; BAUXITE DEPOSITS; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; ELECTRONIC STRUCTURE; GALLIUM NITRIDE; GRAIN BOUNDARIES; IMAGING TECHNIQUES; MAGNESIUM COMPOUNDS; OPTICAL RESOLVING POWER; PROBABILITY DENSITY FUNCTION; SIGNAL TO NOISE RATIO; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH-ANGLE ANNULAR DARK-FIELD IMAGING (HAADF); MGB2; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SRTIO3;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 14544283545     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.05.009     Document Type: Article

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