Investigations of alumina/spinel and alumina/zirconia interfaces by spatially resolved electron energy loss spectroscopy

Journal of the European Ceramic Society

Volumn 18, Issue 10, 1998, Pages 1453-1459

  Suenaga, K ^a,b   Bouchet, D ^b   Colliex, C ^b   Thorel, A ^a   Brandon, D G ^c  

^a CENTRE DES MATÉRIAUX   (France)

^b UNIVERSITÉ PARIS SUD   (France)

^c TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000509375     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00026-0     Document Type: Article

References (35)

1. 1. Bruley, J., Spatially resolved electron energy-loss near-edge structure analysis of a near Σ = 11 tilt boundary in sapphire. Microsc. Microanal. Microstruct., 1993, 4, 23-39.
2. 2. Xioqing, P., Gu, H. and Rühle, M., Grain-boundary microstructure and chemistry of a hot isostatically pressed high-purity silicon nitride. J. Amer. Ceram. Soc., 1996, 79, 2313-2318.
3. 3. Bruley, J., Tseng, M. W. and Williams, D. B., Spectrum-line profile analysis of a mangnesium aluminate spinel/sapphire interface. Microsc. Microanal. Microstruct., 1995, 6, 1-18.
4. 3. Ultramicrosc., 1997, 67, 207-217.
5. 3. Ultramicrosc., 1997, 67, 207-217.
6. 5. Brydson, R., Müllejans, H., Bruley, J., Trusty, P. A., Sun, X, Yeomans, J. A. and Rühle, M., Spatially resolved electron energy-loss studies of metal-ceramic interfaces in transition metal/alumina cermets. J. Mircoscopy, 1995, 177, 369-386.
7. 6. Müllejans, H. and French, R. H., Interband electronic structure of a near-Σ11 grain boundary in α-alumina determined by spatially resolved valence electron energy-loss spectroscopy. J. Phys. D: Appl. Phys., 1996, 29, 1751-1760.
8. 7. Suenaga, K. M., de Haas, M., Thorel, A., Wei, M., Brosh, E. and Brandon, D. G., Microstructures of polycrystalline alumina stacked with alternate doping. ler Colloque de Société Francaise des Microscopies, 1996, pp. 50.
9. 3 diffusion bonds, in preparation.
10. 9. Ugarte, D., Colliex, C. and Trebbia, P., Surface-and interface-plasmon modes on small semiconductiong spheres. Phys. Rev. B, 1992, 45, 4332-4343.
11. 10. Muller, D. A. and Silcox, J., Delocalization in inelastic scattering. Ultramicrosc, 1995, 59, 195-213.
12. 11. Mory, C., Kohl, H., Tence, M. and Colliex, C., Experimental investigation of the ultimate EELS spatial resolution. Ultramicroscopy, 1991, 37, 191-201.
13. 12. Ritchie, R. and Howie, A., Inelastic scattering probabilities in scanning transmission electron microscopy. Phil. Mag. A, 1988, 58, 753-767; Howie, A. and H. Milne, R., Excitations at interfaces and small particles. Ultramicrosc., 1985, 18, 427-433.
14. 12. Ritchie, R. and Howie, A., Inelastic scattering probabilities in scanning transmission electron microscopy. Phil. Mag. A, 1988, 58, 753-767; Howie, A. and H. Milne, R., Excitations at interfaces and small particles. Ultramicrosc., 1985, 18, 427-433.
15. 3 by gel-casting. Journal of the European Ceramic Society, 1995, 15, 1-8.
16. 14. Colliex, C., Tencé, M., Lefevre, E., Mory, C., Gu, H., Bouchet, D. and Jeanguillaume, C., Electron energy loss spectrometry mapping. Mikrochim Acta, 1994, 114/115, 71-87.
17. 15. Jeanguillaume, C. and Colliex, C., Spectrum-image: the next step in EELS digital acqusition and processing. Ultramicr., 1989, 28, 252-257.
18. 16. Suenaga, K., Thorel, A., Houdy, Ph. and Colliex, C., Cross-sectional observation of polymorphic interphases in FeGe multilayers. Microsc. Microanal. Microstruct., 1996, 7, 143-151.
19. 17. Wasynczuk, J. A. and Rühle, M., in Ceramic Microstrucures '86, pp. 341-346.
20. 18. Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd Edn. Plenum, New York, 1996.
21. 3. Phys. Rev. B, 1996, 54, 4604-4608.
22. 20. Cadete Santos Aires, F. J., Cobalt, nickel and copper aluminates characterised by parellel EELS. Inst. Phys. Conf. Ser., 1993, 138, 55-58.
23. 4 spinels from Normalized Ion Energies. J. Am. Cem. Soc., 1983, 111, 1-7.
24. 22. Hansen, P. L., Brydson, R., McComb, D. W. and Richardson, I., EELS fingerprint of Al-coordination in silicates. Microsc. Microanal. Microstruct., 1994, 5, 173-182.
25. x multilayers. J. Phys. Soc. of Japan, 1997, 66, 2097-2102.
26. 24. Kurata, H., Lefevre, E., Colliex, C. and Brydson, R., Electron-energy-loss near-edge structures in the oxygen K-edge spectra of transition-metal oxides. Phys. Rev. B, 1993, 47, 13763-13768.
27. 25. de Groot, F. M. F., Grioni, M., Fuggle, J. C., Ghijsen, J., Sawatzky, G. A. and Petersen, H., Oxygen 1s X-ray-absorption edges of transition-metal oxides. Phys. Rev. B, 1989, 40, 5715-5723.
28. 26. Camagni, P., Samoggia, G., Sangaletti, L., Parmigiani, F. and Zema, N., X-ray-photoemission spectroscopy and optical reflectivity of yttrium-stabilized zirconia. Phys. Rev. B, 1994, 50, 4292-4296.
29. 27. McComb, D. W., Bonding and electronic structure in zirconia pseudopolymorphs investigated by electron energy-loss spectroscopy. Phys. Rev. B, 1996, 54, 7094-7102.
30. 28. Palik, E. D. (ed.), Handbook of Optical Constants of Solids. Academic Press, New York, 1985.
31. 2 interface plasmon peak. Phys. Rev. B, 1997, 56, 6774-6781.
32. 2 interface plasmon peak. Phys. Rev. B, 1997, 56, 6774-6781.
33. 30. Suenaga, K., Colliex C. and Muller D. A., Spatially resolved plasmon analysis at Fe/Ge diffuse interface with steep concentration gradient, in preparation.
34. 3-y (x=0-0·8) investigated by electrical conductivity measurements and electron energy loss spectroscopy. J. Phys. Chem Solids, 1997, 58, 969-976.
35. z thin films. Phys. Rev. Lett., 1997, 79, 3230-3233.