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Volumn 68, Issue 15, 2003, Pages

Arsenic diffusion in relaxed Si1−xGex

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY; ARSENIC; GERMANIUM DERIVATIVE;

EID: 0345305431     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.155209     Document Type: Article
Times cited : (42)

References (44)
  • 33
    • 33646605595 scopus 로고
    • Institution of Electrical Engineers, London
    • INSPEC, Properties of Silicon (Institution of Electrical Engineers, London, 1989), p. 369.
    • (1989) Properties of Silicon


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.