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Volumn 23, Issue 6-8, 2003, Pages 1053-1058
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Real-time studies of Ge growth on nanostructured Si substrates
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Author keywords
Ge Si; Nanostructures; Quantum dots; Scanning Tunneling Microscopy
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Indexed keywords
LITHOGRAPHY;
NANOSTRUCTURED MATERIALS;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTOR QUANTUM DOTS;
SILICON;
SUBSTRATES;
WETTING;
STEP BUNCHING;
GERMANIUM;
NANOTECHNOLOGY;
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EID: 0345118927
PISSN: 09284931
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msec.2003.09.133 Document Type: Article |
Times cited : (6)
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References (29)
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