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Volumn 82, Issue 20, 2003, Pages 3454-3456

Continuous formation and faceting of SiGe islands on Si(100)

Author keywords

[No Author keywords available]

Indexed keywords

MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SEMICONDUCTING SILICON;

EID: 0038387301     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1577386     Document Type: Article
Times cited : (35)

References (15)
  • 1
    • 0030084093 scopus 로고    scopus 로고
    • Washington, DC, U.S.
    • A. P. Alivisatos, Science (Washington, DC, U.S.) 271, 933 (1996).
    • (1996) Science , vol.271 , pp. 933
    • Alivisatos, A.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.