Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 214-221

  Moens, P ^a   Van den Bosch, G ^b   Groeseneken, G ^b,c  

^a Technology R and D   (Belgium)

^b IMEC   (Belgium)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Charge pumping; Competing mechanisms; Dit formation; Hole trapping; Hot carrier degradation; LDMOS; Model

Indexed keywords

ELECTRIC CHARGE; ELECTRON MOBILITY; HOT CARRIERS; SILICA;

CHARGE PUMPING;

MOS DEVICES;

EID: 0038649168     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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