Hot electron degradation and unclamped inductive switching in submicron 60-V lateral DMOS

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1998, Pages 383-393

  Shekar, M S ^a   Williams, Richard K ^a   Cornell, Mike ^a   Luo, Min Yih ^a   Darwish, Mohamed ^a  

^a Siliconix Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; HOT CARRIERS; SEMICONDUCTOR DOPING; VLSI CIRCUITS;

UNCLAMPED INDUCTIVE SWITCHING (UIS);

MOSFET DEVICES;

EID: 0031653673     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)