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Volumn 93, Issue 10 1, 2003, Pages 6107-6116

Analysis of the kinetics for interface state generation following hole injection

Author keywords

[No Author keywords available]

Indexed keywords

HOLE TRAPS; IRRADIATION; MOS DEVICES;

EID: 0038311993     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1567059     Document Type: Article
Times cited : (25)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.