The effect of near-interface network strain on proton trapping in SiO2

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1562-1567

  Vanheusden, K ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NETWORK STRAIN; PROTON TRAP;

ANNEALING; BINDING ENERGY; ELECTRON TRAPS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; PROTONS; QUANTUM THEORY; SILICA; STRAIN;

RADIATION EFFECTS;

EID: 0033328605     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819121     Document Type: Article

References (14)

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