Direct observation of friedel oscillations around incorporated SiGa dopants in GaAs by low-temperature scanning tunneling microscopy

Physical Review Letters

Volumn 76, Issue 7, 1996, Pages 1075-1078

  van der Wielen, M C M M ^a   van Roij, A J A ^a   van Kempen, H ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000824073     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.1075     Document Type: Article

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