Atom structures on the Si(100) surface

Surface Science

Volumn 386, Issue 1-3, 1997, Pages 161-165

  Hashizume, T ^a   Heike, S ^a   Lutwyche, M I ^a   Watanabe, S ^a   Wada, Y ^a  

^a HITACHI LTD   (Japan)

Author keywords

Gallium; Scanning tunneling microscopy; Semiconducting surfaces; Silicon; Surface chemical reaction

Indexed keywords

ADSORPTION; CRYSTAL ATOMIC STRUCTURE; HYDROGEN BONDS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM; SURFACE STRUCTURE;

METAL ATOM STRUCTURES;

SILICON WAFERS;

EID: 0031250811     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00339-7     Document Type: Article

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