An experimental approach for dynamic investigation of the trapping properties of glass-ceramic under electron beam irradiation from a scanning electron microscope

EPJ Applied Physics

Volumn 21, Issue 2, 2003, Pages 137-146

  Fakhfakh, S ^a,b   Jbara, O ^a   Belhaj, M ^c   Fakhfakh, Z ^b   Kallel, A ^b   Rau, E I ^d  

^a CNRS   (France)

^b University of Sfax   (Tunisia)

^c UNIVERSITÉ BORDEAUX 1   (France)

^d MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON IRRADIATION; INSULATING MATERIALS; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY;

TIME CONSTANTS;

GLASS CERAMICS;

EID: 0037328474     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2003001     Document Type: Article

References (35)

1. G.M. Sessler, Electrets, edited by G.M. Sessler (Springer, Berlin, 1980)
2. P.H. Ladbroke, GEC J. Res. 4, 114 (1986)
3. G. Czeremuszkin, M. Latrèche, M.R. Wertheimer, Nucl. Instrum. Methods in Phys. Res. B 185, 88 (2001)
4. J. Liesgang, B.C. Senn, E.R. Smith, J. Appl. Phys. 77, 5782 (1995)
5. A. Cherifi, M. Abou Dakka, A. Toureille, IEEE Trans. Electr. Insul. 27, 1125 (1992)
6. C. Alquié, G. Dreyfus, J. Lewiner, Phys. Rev. Lett. 47, 1483 (1981)
7. M. Bai, R.F.W. Pease, C. Tanasa, M.A. McCord, D.S. Pickard, D. Meisburger, J. Vac. Sci. Technol. B 17, 2893 (1999)
8. B. Valayer, G. Blaise, D. Tréheux, Rev. Sci. Instrum. 70, 3103 (1999)
9. H.J. Wintle, Meas. Sci. Technol. 8, 508 (1997)
10. Z.G. Song, C.K. Ong, H. Hong, J. Appl. Phys. 79, 7123 (1996)
11. J. Bigarré, S. Fayeulle, O. Paulhe, D. Tréheux, Conference on Electrical Insulation and Dielectric Phenomena, IEEE Annual Report 101 (1997)
12. O. Jbara, S. Fakhfakh, M. Belhaj, J. Cazaux, E.I. Rau, M. Filippov, M.V. Andrianov, Nucl. Instrum. Methods in Phys. Res. B (2002)
13. J. Cazaux, Eur. Phys. J. AP 15, 167 (2001)
14. O. Jbara, M. Belhaj, S. Odof, K. Msellak, E.I. Rau, M.V. Andrianov, Rev. Sci. Instrum. 72, 1788 (2001)
15. D.C. Joy, C.S. Joy, Micron 27, 247 (1996)
16. M. Belhaj, O. Jbara, S. Odof, K. Msellak, E.I. Rau, M.V. Andrianov, Scanning 22, 352 (2000)
17. L. Nunes de Oliveira, B. Gross, J. Appl. Phys. 46, 3132 (1975)
18. B. Gross, G. Sessler, J.E. West, J. Appl. Phys. 45, 2841 (1974)
19. A. Melchinger, S. Hofmann, J. Appl. Phys. 78, 6224 (1995)
20. J. Cazaux, J. Appl. Phys. 85, 1137 (1999)
21. G.M. Sessler, G.M. Yang, CSC'3 Proc. SFV, 38 (1998)
22. D.L. Chinaglia, R. Hessel, O.N. Oliviera Jr., Polym. Degradat. Stabil. 74, 97 (2001)
23. QuickField Finite Element Analysis System, Tera Analysis, Svendborg (2001)
24. M. Belhaj, O. Jbara, M.N. Filippov, E.I. Rau, M.V. Andrianov, Appl. Surf. Sci. 177, 58 (2001)
25. M.V. Andrianov, E.I. Rau, J. Cazaux, O. Jbara, M. Belhaj, Surf. Investigation 12, 9 (2000) (in Russian)
26. D.C. Joy, Scanning 11, 1 (1989)
27. L. Reimer, Scanning Electron Microscopy, Physics of Image Formation and Microanalyses (Spinger, Berlin, 1985)
28. J. Cazaux, J. Appl. Phys. 59, 1418 (1986)
29. J. Cazaux, X-ray Spectrom. 25, 265 (1996)
30. O. Jbara, B. Portron, D. Mouze, J. Cazaux, X-ray Spectrom. 26, 291 (1997)
31. O. Jbara, J. Cazaux, P. Trebbia, J. Appl. Phys. 78, 868 (1995)
32. M. Belhaj, S. Odof, K. Msellak, O. Jbara, J. Appl. Phys. 88, 2289 (2000)
33. Y.C. Young, G.T.L. Thong, J.C.H. Phang, J. Appl. Phys. 84, 4543 (1998)
34. M.P. Seah, S.J. Spencer, Electr. Spectrosc. Relat. Phenom. 109, 291(2000)
35. L. Reimer, V. Golla, R. Gongeler, M. Kassens, M. Schindler, R. Senkel, Optik 92, 14 (1992)