Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications

Review of Scientific Instruments

Volumn 72, Issue 3, 2001, Pages 1788-1795

  Jbara, O ^a   Belhaj, M ^a   Odof, S ^a   Msellak, K ^a   Rau, E I ^b   Andrianov, M V ^b  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035274034     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1344596     Document Type: Article

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