An anomalous contrast in scanning electron microscopy of insulators: The pseudo-mirror effect

Scanning

Volumn 22, Issue 6, 2000, Pages 352-356

  Belhaj, M ^a   Jbara, O ^a   Odof, S ^a   Msellak, K ^a   Rau, E I ^b   Andrianov, M V ^b  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

Anomalous contrast; Charging; Scanning electron microscopy; Secondary electrons; X ray maps

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC INSULATING MATERIALS; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON IRRADIATION; MIRRORS;

PSEUDOMIRROR EFFECT; SECONDARY ELECTRONS;

SCANNING ELECTRON MICROSCOPY;

ALUMINUM HYDROXIDE;

ARTICLE; CONTRAST; ELECTRON; ELECTRON MICROSCOPE; IMAGE ANALYSIS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

ALUMINUM OXIDE; ARTIFACTS; ELECTRONS; MICROSCOPY, ELECTRON, SCANNING;

EID: 0034488672     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950220603     Document Type: Article

References (9)

1. Some considerations on the secondary electron emission, δ, from electron-irradiated insulators
2. An anomalous contrast effect in scanning electron microscope
3. Spectral distribution of emitted electrons from insulators under electron irradiation
4. Low voltage scanning electron microscopy
5. Study of the dependence of E2 energies on sample chemistry
6. An annular toroidal electron energy analyser for use in scanning electron microscopy
7. Space charge measurement in a dielectric material after irradiation with 30 kV electron beam: Application to single-crystals oxides trapping properties
8. Analyses of the scanning electron microscope mirror method for studying space charge in insulators