AES of bulk insulators - control and characterization of the surface charge

Journal of Electron Spectroscopy and Related Phenomena

Volumn 109, Issue 3, 2000, Pages 291-308

  Seah, M P ^a   Spencer, S J ^a  

^a Ctr for Mat Msrmt and Technology   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; AUGER ELECTRON SPECTROSCOPY; ELECTRIC CHARGE; ELECTRON BEAMS; MAGNESIA; SECONDARY EMISSION; SILICA; SILICON NITRIDE; SINTERING; SODIUM CHLORIDE;

TOTAL SECONDARY ELECTRON EMISSION YIELD (TSEEY);

ELECTRIC INSULATORS;

EID: 0034274812     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00184-5     Document Type: Article

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